Manual Fault Detection Test Set Minimization.

Abstract

This report describes a manual procedure for minimizing the number of tests necessary to detect a single stuck-at fault in a large scale integrated circuit. (Author)

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1977
Accession Number
ADA040085

Entities

People

  • John Knaizuk Jr.

Organizations

  • Syracuse University

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Air Force
  • Angular Acceleration
  • Circuits
  • Electricity
  • Engineering
  • Flux Density
  • Industrial Engineering
  • Integrated Circuits
  • Large Scale Integrated Circuits
  • Logic
  • Magnetic Fields
  • Magnetic Flux
  • Magnetic Flux Density
  • Radiant Intensity
  • Test Sets
  • Thermal Conductivity
  • Voltage

Readers

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