System Testing and Design for Diagnosability.

Abstract

It is known that many practical sequential circuits cannot be treated by single multivalued systems. The reason for this failure is the loss of information, which is inherent to the use of x as a unique unknown. It is natural to overcome this difficulty by algebraic methods.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1976
Accession Number
ADA040518

Entities

People

  • A. D. Friedman
  • J. P. Hayes
  • M. A. Breuer

Organizations

  • University of Southern California

Tags

DTIC Thesaurus Topics

  • Algorithms
  • Automatic
  • Circuits
  • Computers
  • Data Compression
  • Data Processing
  • Demographic Cohorts
  • Detection
  • Digital Circuits
  • Fault Tolerant Computing
  • Logic
  • Logic Gates
  • Networks
  • Sequences
  • Short Circuits
  • Test Methods
  • Transitions

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.
  • Mathematical Modeling and Probability Theory.