A Portable Residual Stress Analyzer.

Abstract

A portable device for stress measurements based on a position sensitive detector and using a miniature air-cooled X-ray tube was built to demonstrate the potential of such a system. The measuring apparatus, weighing 11 kg, could be held by one person with the electronics housed in a separate cabinet. A variety of steel samples, having from 0 to -700 MPa were tested by comparing measurements made on a diffractometer to those made with the portable device. The device proved to be accurate and accomplished the entire measurement using two psi tilts to a statistical error of less than + or - 40 MPa in under 20 seconds on all samples. (In some cases in 4 seconds.) The portability of the apparatus and rapid measurement time suggest applications for the X-ray stress measurement never possible before, such as on-sight inspection during fabrication or in-field measurements. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jul 12, 1977
Accession Number
ADA041831

Entities

People

  • Jerome B. Cohen
  • Michael R. James

Organizations

  • Northwestern University

Tags

Communities of Interest

  • Air Platforms
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Air Cooled
  • Chemistry
  • Construction
  • Crystal Structure
  • Data Analysis
  • Detectors
  • Diffraction
  • Diffractometers
  • Fabrication
  • Materials Science
  • Measurement
  • Radiation
  • Residual Stress
  • Stress Analysis
  • X Ray Tubes
  • X Rays

Fields of Study

  • Physics

Readers

  • Aerospace Test and Evaluation
  • Materials Science
  • Materials Science and Engineering.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems