Reliability of Microcomputer Systems Using Triple Modular Redundancy.

Abstract

Triple Modular Redundancy (TMR) is a classical technique for improving the reliability of digital systems. However, applying TMR to microcomputer systems may not improve overall system reliability because voter circuits may contribute as much to system unreliability as the microprocessors themselves. We examine the issues that affect the effectiveness of TMR for microcomputer systems, including voter unreliability, considerations for transient recovery, and reliability of semiconductor memory systems. With careful application TMR can improve the mission time of a small system by a factor of three or more. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1975
Accession Number
ADA042246

Entities

People

  • John F. Wakerly

Organizations

  • Stanford University

Tags

Communities of Interest

  • Advanced Electronics
  • Ground and Sea Platforms
  • Weapons Technologies

DTIC Thesaurus Topics

  • Circuits
  • Computers
  • Electrical Engineering
  • Electronics
  • Electronics Laboratories
  • Engineering
  • Failure Mode And Effect Analysis
  • Integrated Circuits
  • Large Scale Integration
  • Microprocessors
  • Military Research
  • New Mexico
  • New York
  • Personal Computers
  • Redundancy
  • Reliability
  • Semiconductors

Fields of Study

  • Engineering

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.
  • Neuroscience
  • Software Engineering

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems