Confidence Intervals Related to Sequential Tests for the Exponential Distribution.

Abstract

One sided sequential tests for the mean of an exponential distribution are proposed, and the related confidence intervals are computed. The tests behave like the classical sequential probability ratio test when the mean is small and like a fixed time test when the mean is large and accurate estimation is important. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Oct 10, 1977
Accession Number
ADA049758

Entities

People

  • David Siegmund

Organizations

  • Stanford University

Tags

Communities of Interest

  • Human Systems
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Boundaries
  • California
  • Computational Science
  • Computations
  • Confidence Limits
  • Errors
  • Industrial Production
  • Intervals
  • Military Research
  • Probability
  • Production
  • Quality Control
  • Random Variables
  • Random Walk
  • Statistics
  • United States
  • United States Government

Fields of Study

  • Mathematics

Readers

  • Statistical inference.