Manufacturing Methods and Engineering for TFT Addressed Display.
Abstract
During this period the major emphasis has been on fabricating a number of high quality displays. The process improvements previously identified as necessary for success were implemented with the result that the objective has been met. Four highly legible half panels were packaged into two engineering samples and tested. One sample incorporates a deposition sequence change which improved drift characteristics. A total of 38 substrates (starts) were made and evaluated on the basis of quality and transistor characteristics prior to packaging. This data has been summarized and tabulated. Abnormal transistor drift was an important factor contributing to rejects together with marginal mask alignment and mask to substrate contact. Parallel effort to resolve the problems of transistor drift was begun in the development activity. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 28, 1978
- Accession Number
- ADA054273
Entities
People
- F. C. Luo
- H. Y. Wey
- M. Green
- S. D. Burkholder
- W. L. Rogers
Organizations
- Westinghouse Electric Corporation