Electrical Characterization of Linear Integrated Circuits,

Abstract

This report covers the work performed by General Electric, Ordnance Systems pertaining to the electrical characterization and specification of linear microcircuits. The period of report is July 1977 to July 1978. Characterization was performed on five generic classes of parts and nineteen device types. The generic classes covered are quad op amps, quad comparators, D/A converters, Bi-FET op amps and negative regulators. Software programs were developed for automatic testing on a Tektronix 3263 automatic test system. Data resulting from this effort is available under separate cover. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1979
Accession Number
ADA065997

Entities

People

  • Donald Van Alstyne
  • Herbert Labb
  • John Kulpinski
  • Richard Paskowsky
  • Theodore Simonsen

Organizations

  • General Electric

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Human Systems
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Accuracy
  • Bipolar Junction Transistors
  • Databases
  • Electronics Industry
  • Electronics Laboratories
  • Failure Mode And Effect Analysis
  • Integrated Circuits
  • Measurement
  • Modules (Electronics)
  • P-N Junctions
  • Power Supplies
  • Standards
  • Statistical Data
  • Temperature Coefficients
  • Test And Evaluation
  • Test Equipment
  • Voltage Regulators

Fields of Study

  • Engineering

Readers

  • Business Analytics
  • Control Systems Engineering.
  • Integrated Circuit Design and Technology.

Technology Areas

  • Microelectronics