A Preliminary Study of Built-in-Test for the Military Computer Family (MCF).
Abstract
This study has addressed the use of built-in-test (BIT) for fault detection, isolation, and repair in the Military Computer Family (MCF). Particular emphasis was given to the identification and assessment of BIT techniques applicable to the MCF-AN/UYK-41(V). The MCF-AN/UYK-41(V) is software compatible with Digital Equipment Corporation's PDP-11/70. The approach taken in this study was to assume a fault population, predict where in the system these faults are most likely to occur and develop a rationale for deploying built-in fault detection and localization resources accordingly. The fault population assumed included both stuck-at and transient faults. It was determined using a failure prediction program based on MIL-HDBK-217B that for related computers, it is likely that 60% of all faults will occur in memory, 30% will be in the CPU and the remainder will happen throughout the rest of the computer including the power supply.
Document Details
- Document Type
- Technical Report
- Publication Date
- Mar 01, 1979
- Accession Number
- ADA067744
Entities
People
- Atul Jai
- Dan Siewiorek
- J. B. Clary
- Richard Soeks
- Scott Weikel
Organizations
- Battelle Memorial Institute