Semiconductor Technology Program - Progress Briefs.

Abstract

Contents: Cross-Bridge Sheet Resistors; Laser-Induced Surface Patterns; Analysis of PVW Data; Optical Linewidth Measurements; Linewidth Measurement Seminars; Moisture Measurement Workshops; Update - Film Thickness Standards; Erratum - NBS Spec. Publ. 400-61; Recent Publications; Publications in Press.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1981
Accession Number
ADA098029

Entities

People

  • W. Murray Bullis

Organizations

  • National Institute of Standards and Technology

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Aeronautical Laboratories
  • Change Detection
  • Computer Programs
  • Computers
  • Data Analysis
  • Electrical Engineering
  • Electronics
  • Electronics Industry
  • Electronics Laboratories
  • Energy Systems
  • Engineering
  • Integrated Circuits
  • Measurement
  • Modules (Electronics)
  • Semiconductor Devices
  • Semiconductors
  • Solar Energy

Fields of Study

  • Physics

Readers

  • Academic Conference Management
  • Business Analytics
  • Thin Film Deposition Science.

Technology Areas

  • Directed Energy
  • Microelectronics
  • Microelectronics - Graphene