Electrical Characterization of Microprocessor Memories.
Abstract
With the advent of microprocessors, considerable design activity has occurred in the development of semiconductor memories as an integral part of the family with the microprocessors. These memories tend to be organized in byte fashion or some submultiple or multiple of the 8 bits. Selected memories of this type have been evaluated and MIL-M-38510 detail specifications written for those devices deemed appropriate. Evaluation consisted of normal DC and AC parameter limit testing, functional tests and electrical characterization studies. The characterization studies included Schmoo plots of selected parameters that were considered critical, including AC timing requirements. The following types of memories were evaluated: Static RAMS, ROM, Fused PROM, Programmable Array Logic, Field Programmable Logic Arrays, Ultraviolet Erasable PROMS, and Electrically Erasable ROMS. Ten detail specifications were written for the foregoing types of parts as follows: Static RAMS - 1) 2147, 2147H, 2114, 2148; 2)6810; 3) 27S07A, 27S03A; 4) ROM - S6831B; 5) PAL - 10H8, 12H6, 14H4, 16H2; 6) FPLA - 82S100, 93458; 7) UV/EPROM-2716; 8) TMS 2532; 9) 6654; 10) EAROM-2810, 7810. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1981
- Accession Number
- ADA102305
Entities
People
- Ted Y. Fujimoto
Organizations
- Hughes Aircraft Company