DNA Electrical Overstress - Hardness Assurance Data Volume.

Abstract

This volume contains experimental data taken in support of the development of electrical overstress hardness assurance techniques. The data was taken to investigate two areas: causes of maverick behavior and factors determining nominal (20) hardness. The devices tested were specially designed silicon-on-sapphire diodes. These devices had controlled variation in the manufacturing parameters such as junction area, doping levels and epitaxial thickness for the investigation of nominal device hardness. The devices also included simulated manufacturing defects for the investigation of maverick behavior. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Jul 28, 1980
Accession Number
ADA105558

Entities

People

  • D. C. Wunsch
  • Robert Turfler

Organizations

  • Braddock Dunn & McDonald

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Aerospace Industry
  • Air Force
  • Crystal Structure
  • Databases
  • Department Of Defense
  • Diffusion
  • Electric Fields
  • Fabrication
  • Failure Mode And Effect Analysis
  • Geometry
  • Navy
  • Plastic Explosives
  • Semiconductors
  • Systems Engineering
  • Test Methods
  • Waveforms
  • Zener Diodes

Fields of Study

  • Materials science

Readers

  • Metallurgy
  • Semiconductor Device Technology