Design, Test, and Comparative Analysis of Programmable Interface Unit Circuit Configurations.

Abstract

This report documents the results of analytic calculations and laboratory testing performed on three proposed configurations to solve power transistor overheating in the programmable interface unit (PIU) of the Hybrid Automatic Test Station (HATS). Recommendations are made regarding the most effective configuration in terms of cost and performance. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1982
Accession Number
ADA114725

Entities

People

  • G. Evans
  • H. Dill
  • O. Zalamia

Organizations

  • ARINC

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Automatic
  • California
  • Circuit Analysis
  • Circuit Boards
  • Circuits
  • Computer Programs
  • Contracts
  • Failure Mode And Effect Analysis
  • Frequency
  • Frequency Response
  • Measuring Instruments
  • Naval Air Stations
  • Printed Circuit Boards
  • Printed Circuits
  • Stations
  • Test And Evaluation
  • Thermal Resistance

Readers

  • Integrated Circuit Design and Technology.
  • Software Engineering
  • Systems Analysis and Design