CD Applications Study.
Abstract
Four new test structures which have been fabricated, including a first-order low-pass recursive switched-capacitor filter, a charge divider, an ED-NMOS operational amplifier, and an improved surface-channel CCD unit delay multiplier/first-order filter, are discussed. Also included are the results of an experiment performed on the old surface-channel CCD and an ISPICE computer simulation of a switched-capacitor current-mirror half-section. An inverting switched-capacitor network is presented. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 01, 1982
- Accession Number
- ADA115637
Entities
People
- B. Hanzal
- D. R. Lamb
- J. D. Joseph
- P. C. T. Roberts
- T. T. Vu
Organizations
- Honeywell International, Inc.