Analysis of Electron Traps in Silicon and Gallium Arsenide by Deep-Level Transient Spectroscopy.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1982
Accession Number
ADA124422

Entities

People

  • Ruthanna Yusa Dejule

Organizations

  • University of Illinois Urbana–Champaign

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Charge Carriers
  • Compound Semiconductors
  • Conduction Bands
  • Electrical Engineering
  • Electron Beams
  • Electrons
  • Emission
  • Energy Bands
  • Energy Levels
  • Equations
  • Gallium Arsenides
  • Heat Of Activation
  • Materials
  • Measurement
  • P-N Junctions
  • Semiconductors

Technology Areas

  • Microelectronics