EMC (Electromagnetic Compatibility) Modeling and Analysis - A Probabilistic Approach.

Abstract

This report provides a new and fundamental basis for EMC analysis, i.e. a probabilistic approach. The advances in high speed, high density integrated circuit (IC) technology provides the impetus for investigating new concepts in electromagnetic compatibility/electromagnetic interference (EMC/EMI). Performance criteria, acceptable performance, EMI performance curve and performance threshold are concepts related to susceptibility level in a probabilistic manner. In addition, the interaction at different levels (e.g. system, subsystem, equipment, component) are also discussed. Because large portions of systems are being replaced by complex ICs and because the electromagnetic environment and equipment susceptibility are in reality, random in nature, a probabilistic approach enables one to develop a statistical macromodel. In such an approach, detailed circuit models and functions are replaced by statistical models where probability density functions are used to evaluate probabilities and statistical averages associated with various responses at various operational levels. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1983
Accession Number
ADA135664

Entities

People

  • A. Ephreth
  • D. D. Weiner

Organizations

  • Syracuse University

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Circuits
  • Communication Systems
  • Differential Equations
  • Electromagnetic Compatibility
  • Electromagnetic Environments
  • Electromagnetic Interference
  • Electromagnetic Radiation
  • Engineering
  • Environment
  • Equations
  • Experimental Data
  • Plastic Explosives
  • Probabilistic Models
  • Probability
  • Probability Density Functions
  • Radar
  • Random Variables

Readers

  • Aerospace Test and Evaluation
  • Computational Modeling and Simulation