Techniques of Flash Radiometry.
Abstract
This document analyzes in detail flash radiometry techniques for determining the thermal diffusivity of thin condensed samples. Such techniques rely on the transient infrared radiation from the sample heated by a short-duration pulsed radiation. Exact analytical solution for the conventional transmission measurement (in which the excitation source and the infrared detector are on opposite sides of the sample) as well as the backscattering measurement (in which the excitation source and detector are on the same side of the sample) are presented with the effect of heat loss neglected. The analysis allows the determination of the thermal diffusivity and the absorption coefficients at the excitation wavelength and at the detecting wavelength of the sample from the experimental data. The effects of excitation pulse duration and finite rise time of the detection system are discussed. Experiments on pulsed radiometry measurements on thin film samples are performed to verify some of these theoretical predictions. Radiation loss and two-dimensional head diffusion loss are shown to be negligible for thin film samples. (Author)
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 20, 1984
- Accession Number
- ADA138412
Entities
People
- A. C. Tam
- W. P. Leung
Organizations
- International Business Machines Corporation (Armonk, NY)