Formation of a Limiting Composition in the Preparation of Ternary III-V Semiconductors by the VPE (Vapor Phase Epitaxy) Hydride Technique,

Abstract

A study was undertaken to improve the quality of epitaxial layers of GaxIn1-xAs semiconductors by adding a continuous hydrogen chloride (HC1) etch to the mixing zone of the reactor in the vapor phase epitaxy (VPE)-hydride technique. An unusual observation was noted when the partial pressure of HC1 in the mixing zone was equal to or greater than .007 atm in the present study. At these partial pressures of HC1, only one ternary is formed and has a composition corresponding to Ga0.87zin0.13As. This phenomenon is explained with a mechanism based on the Langmuir's adsorption isotherm, where saturated HC1 absorption occurs. The study shows that the net growth rates of layer formation changes from positive to negative values with increasing pressures of HC1 in the mixing zone.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1984
Accession Number
ADA147639

Entities

People

  • K. P. Quinlan
  • T. E. Erstfeld

Organizations

  • Rome Laboratory

Tags

Communities of Interest

  • Air Platforms
  • Biomedical

DTIC Thesaurus Topics

  • Abstracts
  • Air Force
  • Alcohols
  • Chemical Compounds
  • Chemistry
  • Classification
  • Crystals
  • Flow Rate
  • Partial Pressure
  • Phase
  • Reaction Time
  • Security
  • Semiconductors
  • Substrates
  • Thickness
  • Vapor Phases
  • X Rays

Fields of Study

  • Materials science

Readers

  • Combustion Dynamics and Shock Wave Physics.
  • Plasma Physics.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene