A Study of Relaxation Techniques for the Transient Analysis of Digital Circuits.

Abstract

In the VLSI microelectronics era, the cost of the immense CPU time and memory storage for a 'standard' circuit simulator has become prohibitive. In order to achieve dramatic improvement in the performance of the circuit simulator, there are two principal points of departure from the 'standard' simulation approach, namely, 'tearing' decomposition and 'relaxation' decomposition. This research is to study the numerical convergence and stability properties of several of the relaxation algorithms that have been proposed for the simulation of VLSI circuits. The time-point Gauss-Seidel method with prediction, the exploitation of latency and event scheduling algorithms are implemented into a general purpose circuit simulator SLATE-R (a Simulator with Latency and Tearing --Relaxed version). The performance of the SLATE-R program in the analysis of various types of integrated circuit technologies is studied. Keywords include: Microelectronics, standard, tearing, relaxation, decomposition, and exploitation.

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Document Details

Document Type
Technical Report
Publication Date
Jun 03, 1985
Accession Number
ADA161854

Entities

People

  • Wei-kong Chia

Organizations

  • University of Illinois Urbana–Champaign

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Bipolar Junction Transistors
  • Circuit Analysis
  • Circuits
  • Differential Equations
  • Digital Circuits
  • Electronics Laboratories
  • Engineering
  • Integrated Circuits
  • Lists (Data Structures)
  • Networks
  • Nonlinear Algebraic Equations
  • Semiconductor Devices
  • Semiconductors
  • Simulations
  • Simulators
  • Solid State Electronics
  • Standards

Fields of Study

  • Engineering

Readers

  • Computer Engineering
  • Operations Research
  • Systems Analysis and Design

Technology Areas

  • Microelectronics