Time-Domain Reflectometry Using Scattering Parameters and a De-Embedding Application

Abstract

Time-Domain Reflectometry (TDR) has widespread use within the microwave industry as a primary investigation tool. Conventional TDRs utilize a pulse as the standard source to excite the device under test (DUT) and provide information of the DUT7s characteristic in a strictly time-domain sense. This information is not readily available for processing and hence somewhat limits the scope of usage. In this work, a TDR is simulated by using measured values of scattering parameters and a source which can be specified by the user. It achieves the latter by modelling the excitation source as a regular trapezoid and allows the user to vary the rise time and pulsewidth as the response of the DUT is observed. This technique was utilized in solving the 'de-embedding' problem where the effects of the connector between the measuring set and the DUT were effectively removed. The resulting waveform represented the response of the DUT alone and not the DUT/connector composite. Keywords include: S-parameter TDR; Scattering parameter; and Time-domain reflectometry.

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1986
Accession Number
ADA168194

Entities

People

  • A. S. Ali
  • Raj Mittra

Organizations

  • University of Illinois Urbana–Champaign

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Connectors
  • Frequency
  • Frequency Bands
  • Frequency Domain
  • Generators
  • Impedance
  • Measurement
  • Reflectometers
  • Reflectometry
  • Scattering
  • Signal Generators
  • Simulations
  • Test Sets
  • Time Domain
  • Time Domain Reflectometer
  • Time-Domain Reflectometry
  • Transmission Lines

Readers

  • Approximation Theory.
  • Microwave Engineering.
  • Optical Fiber Sensing and Electromagnetic Propagation.