Automatic Microwave Semiconductor Device Testing.

Abstract

During the past three months the project team has focused efforts in the following areas: Computer System/Software Selection, Device Fixturization/Analysis, System Hardware Selection, Measurement Technique Investigation, and ECP Formalization.

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Document Details

Document Type
Technical Report
Publication Date
Mar 03, 1986
Accession Number
ADA173424

Entities

People

  • Chi-bong Lok
  • Edward A. Whitman

Organizations

  • Harris Corporation

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Analyzers
  • Calibration
  • Computer Programs
  • Computers
  • Corporations
  • Electronics
  • Industrial Preparedness
  • Low Temperature
  • Measurement
  • Microwaves
  • New York
  • Resource Management
  • Semiconductor Devices
  • Semiconductors
  • Software Design
  • Software Testing
  • Test Fixtures

Fields of Study

  • Engineering
  • Physics

Readers

  • Software Engineering.
  • Technical Research and Report Writing.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems