Automated Testing and Fault Isolation of a Low Frequency Analog Circuit Card Assembly,

Abstract

This thesis describes the automated testing and fault isolation which is performed on a Circuit Card Assembly (CCA) used in a complex naval weapons system. The automated testing is performed using a Hewlett Packard 9826 computer and IEEE-488 bus compatible equipment which comprise the Test Set known as the TE304. A complete circuit analysis of the CCA being tested is included in this thesis as well as program descriptions of the Acceptance Test Program and the Fault Isolation Program. Also included in this thesis is background information on the TE304 Automated Test Set, the equipment which make it up, and the software which is used to control it. This thesis was made possible through a U. S. Navy contract between the University of Louisville Electrical Engineering Department and the Naval Ordnance Station in Louisville. (Author)

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Document Details

Document Type
Technical Report
Publication Date
Sep 17, 1986
Accession Number
ADA177074

Entities

People

  • Michael D. Pilkenton

Organizations

  • University of Louisville

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Acceptance Tests
  • Circuit Analysis
  • Circuits
  • Computer Programs
  • Computers
  • Engineering
  • Flip Flop Circuits
  • Logic Gates
  • Measurement
  • Nand Gates
  • Networks
  • Operating Systems
  • Operational Amplifiers
  • Power Supplies
  • Production Engineering
  • Test Sets
  • Voltage

Fields of Study

  • Engineering

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Maritime and Naval Warfare Studies
  • Software Engineering