UW VLSI Chip Tester

Abstract

We present a design for a low-cost, functional VLSI chip tester. It is based on the Apple MacIntosh II personal computer. It tests chips that have up to 128 pins. All pin drivers of the tester are bidirectional; each pin is programmed independently as an input or an output. The tester can test both static and dynamic chips. Rudimentary speed testing is provided. Chips are tested by executing C programs written by the user. A software library is provided for program development. Tests run under both the Mac Operating System and A/UX. The design is implemented using Xilinx Logic Cell Arrays. Price/ performance tradeoffs are discussed.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1989
Accession Number
ADA220789

Entities

People

  • Neil Mckenzie

Organizations

  • University of Washington

Tags

Communities of Interest

  • Energy and Power Technologies
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Application Software
  • Circuits
  • Clocks
  • Complementary Metal-Oxide Semiconductors
  • Computer Programming
  • Computer Programs
  • Computer Science
  • Computers
  • Costs
  • Engineering
  • Host Computers
  • Information Systems
  • Lisp Programming Language
  • Operating Systems
  • Parallel Ports
  • Personal Computers
  • Simulations

Readers

  • Computer Science.
  • Integrated Circuit Design and Technology.