Random Logic Oxide Screening Methods

Abstract

This report covers the work performed on the Random Logic Oxide Screening Methods study in which techniques were investigated to improve oxide reliability screening methods in CMOS random logic devices. This effort included modeling of time dependent dielectric breakdown in state-of-the-art gate oxides, development of both internal and external screening techniques, and the performance of a screen and accelerated life test to verify predicted screening effects.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1990
Accession Number
ADA230579

Entities

People

  • Douglas N. Krening

Organizations

  • Martin Marietta

Tags

Communities of Interest

  • Advanced Electronics
  • Biomedical

DTIC Thesaurus Topics

  • Computer Programs
  • Computers
  • Data Analysis
  • Databases
  • Failure Mode And Effect Analysis
  • Information Processing
  • Information Science
  • Life Tests
  • Logic
  • Logic Devices
  • Logic Gates
  • Regression Analysis
  • Signal Generators
  • Space Systems
  • Test And Evaluation
  • Test Equipment
  • Test Fixtures

Fields of Study

  • Engineering

Readers

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  • Systems Analysis and Design
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