Study of Surface Phenomena in Ceramics by Item

Abstract

The use of transmission electron microscopy for the study of a range of phenomena associated with the surfaces of ceramic materials is discussed. The approach used throughout the work described has been to prepare a thinned sample in a form suitable for imaging in the electron microscopy and then to modify the characteristics of this sample by heat treating it. The same sample is then used for further studies by depositing metallic or ceramic particles on the surface. The material systems illustrated include SiC and Al2O3 as the thin film with the particles being Cu, W, ThO2 or NiO.

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Document Details

Document Type
Technical Report
Publication Date
May 05, 1989
Accession Number
ADA232383

Entities

People

  • C. B. Carter
  • David W. Susnitzky

Organizations

  • Cornell University

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms

DTIC Thesaurus Topics

  • Ceramic Materials
  • Chemical Vapor Deposition
  • Composite Materials
  • Crystal Structure
  • Crystallography
  • Crystals
  • Electron Microscopes
  • Electron Microscopy
  • Films
  • Heat Treatment
  • Materials
  • Materials Processing
  • Materials Science
  • Microscopy
  • Surface Energy
  • Surface Properties
  • Thin Films

Fields of Study

  • Materials science

Readers

  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene