A Goodness-of-Fit Test for a Family of Two Parameter Weibulls with Known Shape Using Minimum Distance Estimation of Parameters

Abstract

This research is to produce a modified Anderson-Darling goodness of fit test for the Weibull distribution when the location parameter is found by minimum distance estimation, the shape parameter is assumed known, and the MLE is used for the scale parameter. The critical values for the Anderson-Darling test are generated via Monte Carlo simulation when both the Anderson-Darling and Cramer-Von Mises distance statistics are minimized. These critical values are then used for a power study. The Monte Carlo simulation used 5000 repetitions for sample sizes of 5,8,12,15,16,20 and 25 with the Weibull shape parameter of . 5(.5)4.0. The power study is made for the same sample sizes as above with the hypothesized Weibull shape parameter of 1.0 and 3.5 against ten alternate hypothesized distributions. For small sample sizes, improvement can be seen over tests which use MLEs for the location and scale parameters. However, for larger sample sizes, more than 20, the power is similar to other goodness-of-fit tests for the Weibull. In most cases, minimizing the Anderson-Darling distance statistic to estimate the Weibull location parameter had more power than minimizing the Cramer-Von Mises distance statistic.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1991
Accession Number
ADA238633

Entities

People

  • John S. Crown

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Computers
  • Data Science
  • Data Sets
  • Distribution Functions
  • Estimators
  • Goodness Of Fit Tests
  • Information Science
  • Monte Carlo Method
  • Normal Distribution
  • Probability
  • Probability Density Functions
  • Random Variables
  • Reliability
  • Simulations
  • Statistical Algorithms
  • Statistics

Fields of Study

  • Mathematics

Readers

  • Approximation Theory.
  • Regression Analysis.