Analysis and Demonstration of Diagnostic Performance in Modern Electronic Systems

Abstract

This report presents methods and procedures for validation and demonstration of diagnostic system performance for use as part of the Government's acceptance test procedures for electronic systems having contractual diagnostic requirements. These methods provide for examining the adequacy of the diagnostics architecture, establishing bounds on fraction of faults detected (FFD) and fraction of faults isolated (FFI) (the only two figures of merit considered here), and choosing faults to be inserted in the demonstration, but fall short of confirming exact values for FFD and FFI. The current state-of-the-art does not support an exact determination of FFD and FFI for new equipment, especially that containing higher density VLSI and VHSIC electronic devices, because of the inability to determine the failure rates for the various failure modes, and the difficulty in inserting a truly random sample of faults.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1991
Accession Number
ADA241621

Entities

People

  • James C. Deckert
  • Jerold L. Weiss
  • Kevin B. Kelly

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Human Systems
  • Materials and Manufacturing Processes
  • Space

DTIC Thesaurus Topics

  • Acceptance Tests
  • Air Force
  • Circuit Analysis
  • Circuit Boards
  • Circuit Testers
  • Complementary Metal-Oxide Semiconductors
  • Control Systems
  • Digital Circuits
  • Failure Mode And Effect Analysis
  • Integrated Circuits
  • Logic Gates
  • Reliability
  • Semiconductors
  • Statistical Sampling
  • Test And Evaluation
  • Test Equipment
  • Test Methods

Readers

  • Gulf War Illness and Chronic Multisymptom Illness in Veterans.
  • Parallel and Distributed Computing.
  • Software Engineering

Technology Areas

  • Microelectronics