Design for Reliability - Current Density
Abstract
This work describes the computation of expected and variance current density waveforms in sections of the power/ground bus for the purpose of estimating MTF due to electromigration. This work involves three main tasks: (1) Further development and enhancement of probabilistic simulation methods for computing current and voltage waveform statistics; (2) development of hierarchical extraction software for the generation of the circuit netlist and parasitics from hierarchically described layouts; (3) computation of expected value and variance current density waveforms in the RC model of the bus. The probabilistic approach for computing current and voltage statistics has been made more general and refined especially as related to the variance of the current waveforms. The extraction software reads hierarchically described layouts, and generated circuit descriptions with the same hierarchy. An approach for computing the expected value and variance of the current density for electromigration evaluation has been implemented which uses network reduction and sparse matrix techniques. The advances are described and applied to test cases for evaluation.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 1992
- Accession Number
- ADA254770
Entities
People
- Hungse Cha
- Ibrahim N. Hajj
- Richard Burch
- Russell Iimura
- Vasant B. Rao
Organizations
- University of Illinois Urbana–Champaign