On the Suitability of Non-Hardened High Density SRAMs for Space Applications

Abstract

Several non-radiation-hardened high density static RAMs (SRAMs) were tested for susceptibility to single-event upset (SEU) and (latchup). Test results indicated that at present only a few such device types are suitable for use in space applications. Several additional factors such as susceptibility to multiple-bit upsets and to radiation-induced permanent damage need to be taken into consideration before these device types can be recommended. One non-hardened SRAM device type has recently been used on a low-Earth orbit satellite, enabling the upset rate measured in space to be compared to that predicted from ground-based testing.

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Document Details

Document Type
Technical Report
Publication Date
Jul 16, 1992
Accession Number
ADA255898

Entities

People

  • B. K. Yi
  • D. D. Lau
  • R. Chitty
  • Rokutano Koga
  • S. D. Pinkerton
  • W. R. Crain

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Space

DTIC Thesaurus Topics

  • Air Force
  • Air Force Facilities
  • Altitude
  • Artificial Satellites
  • Classification
  • Corporations
  • Cosmic Rays
  • Determinants (Mathematics)
  • Earth Orbits
  • Ground Based
  • High Density
  • Orbits
  • Radiation
  • Security
  • Solar Activity
  • Solar Flares
  • Trajectories

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Space Exploration and Orbital Mechanics.

Technology Areas

  • Space