Application of Error Correcting Codes in Fault-Tolerant Logic Design for VLSI Circuits

Abstract

The use of error detecting/correcting codes in self-checking and fault-tolerant logic design has been receiving considerable attention in recent years. In this report we present the results of our investigation in the application of such codes. We have developed a technique based on low-cost residue code to design arbitrary combinational logic circuits with self-checking capability. We also proposed a technique which allows detection of single, and up to three bits of multi-bit errors in multi-output combinational logic circuits; the major advantage of this technique is that the error detecting capability depends on the output bits of a circuit rather than its internal complexity. A technique for implementing fully testable sequential circuits from their specifications has also been proposed. This technique eliminates the post- design circuit modifications as used in the currently popular scan-based techniques.

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Document Details

Document Type
Technical Report
Publication Date
Aug 14, 1992
Accession Number
ADA264071

Entities

People

  • H. L. Martin
  • P. K. Lala

Organizations

  • North Carolina Agricultural and Technical State University

Tags

DTIC Thesaurus Topics

  • Air Force
  • Circuits
  • Coding
  • Complementary Metal-Oxide Semiconductors
  • Computer-Aided Design
  • Detection
  • Electrical Engineering
  • Engineering
  • Failure Mode And Effect Analysis
  • Fault Tolerant Computing
  • Integrated Circuits
  • Large Scale Integration
  • Logic Gates
  • Networks
  • Scientific Research
  • Simulations
  • Very Large Scale Integration

Fields of Study

  • Engineering
  • Physics

Readers

  • Computer Programming and Software Development.
  • Integrated Circuit Design and Technology.
  • Radio communications and signal processing.