NASA Boeing 757 Cavity Field Variability Based on Boeing 757 and Boeing 707 Test Data.

Abstract

The NASA Langley Research Center conducted an extensive ground and flight test program to validate detailed modeling of the Boeing 757 aircraft. Most of the ground and flight test data were obtained using D-dot probes in fixed locations in the cockpit, electronics bay, and passenger cabin. An open question was the uncertainties that may be expected for the comparison of experimental measurements and model predictions. The Naval Surface Warfare Center, Dahlgren Division and the USAF Phillips Laboratory had performed cavity characterization tests on the same Boeing 757 as used for the flight tests. Extensive cavity characterization data was also available for a Boeing 707 aircraft. While the three specific flight test comparison frequencies were not investigated in these tests, sufficient data were available to provide estimates of the expected uncertainties. Some of the data in the cavity characterization tests were collected with the flight test D-dot probes in the same locations. A summary of the results is presented as a standard deviation in decibels in a series of tables for each cavity and each frequency.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1997
Accession Number
ADA328539

Entities

People

  • Gustav J. Freyer
  • Mark D Johnson
  • Michael B. Slocum
  • Michael O. Hatfield

Organizations

  • Naval Surface Warfare Center

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Aircrafts
  • Bandwidth
  • Boundaries
  • Databases
  • Defense Systems
  • Electromagnetic Properties
  • Electronics
  • Frequency
  • Frequency Standards
  • Insertion Loss
  • Measurement
  • Passengers
  • Standards
  • Surface Warfare
  • Transport Aircraft
  • Uncertainty
  • Warfare

Readers

  • Aerospace logistics and air mobility.
  • Regression Analysis.
  • Technical Research and Report Writing.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems