WOCSDICE 97: 21st Workshop on Compound Semiconductor Devices and Integrated Circuits Held on May 25-28 1997 in Scheveningen, The Netherlands

Abstract

Partial contents: "Reliability and degradation of HEMTs and HBTs; "High Temperature Operation of GaAs Based HFET Structure Containing Layers Grown at Low Temperature"; "Application of Semiconductor Interface Modelling to Reliability Characterisation"; Metal probe technique for characterisation of semiconductor materials used in optoelectronic devices"; "A Novel Approach for Determining the Reliability of AlGaAs/GaAs HBTs from Low-Frequency Noise Characteristics"; Optoelectronics; "Photonic Integrated Circuits for multiwavelength applications"; "Polarization independent InGaAs/InP chopped quantum well interferometric space switch at 1.55 pm"; "Design and analysis of a 1 x 8 wavelength division multiplexer based on the self-imaging theory"; "Design and analysis of a 1 x 32 tapered coupler based on the self-imaging theory".

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Document Details

Document Type
Technical Report
Publication Date
May 01, 1997
Accession Number
ADA341225

Entities

Organizations

  • Eindhoven University of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • 5G Wireless Networks
  • Amplitude Modulation
  • Bandwidth
  • Circuit Analysis
  • Electronics Laboratories
  • Energy Bands
  • Field Effect Transistors
  • High Electron Mobility Transistors
  • Manufacturing
  • Materials
  • Metal-Semiconductor Junctions
  • Mobile Phones
  • Modules (Electronics)
  • Power Electronics
  • Radio Frequency Devices
  • Semiconductor Devices
  • Semiconductors

Fields of Study

  • Materials science

Readers

  • Academic Conference Management
  • Optical Physics and Photonics.
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Quantum Computing
  • Space