Optical and Electrical Characterization of Vandium-Doped SiC

Abstract

The purpose of this investigation was to characterize the material produced by Northrop Grumman during an effort to obtain semi-insulating SiC. The semi-insulating SiC is needed to further develop devices operating at microwave frequencies. High temperature Hall effect, Deep Level Transient Spectroscopy (DLTS), optical absorption, Fourier Transform Infrared (FTIR) spectroscopy, and Thermally Stimulated Current (TSC) measurements were employed in concert to examine the resultant boules. The polytypes examined were 4H, 6H, and 15R. The product of these experiments was that three levels were detected which were related to the vanadium incorporation. The deepest level (at E sub c -1.35 eV) detected in 6H-SiC as a part of these experiments was identified as the isolated substitutional vanadium donor level (0/+). This confirmed previous predictions about the depth of the donor level. Wafers were found whose Fermi level was pinned at the vanadium donor resulting in insulating crystals (extrapolated to the 10 to the 18th power OMEGAcm at RT). The donor level was occupied due to the partial compensation by the boron acceptor which is ubiquitous in undoped SiC samples. The other level related to the isolated, substitutional configuration of vanadium is the acceptor level. This investigation was the first to discover the position of this level within the SiC band gap. DLTS and Hall effect evinced an acceptor level position of E sub c -0.8 eV for the 4H polytype. Hall effect was employed exclusively to ascertain the position in the 6H polytype (at E sub c -0.66 eV). This level was observed in samples whose boron acceptor and vanadium donor levels were compensated by the common donor dopant, nitrogen. The DLTS results also indicated that the vanadium level can be incorporated in concentrations up to 3 x 10 to the 17th power per cu cm.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
May 01, 1996
Accession Number
ADA342839

Entities

People

  • Jason R. Jenny

Organizations

  • Carnegie Mellon University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Band Structures
  • Charge Carriers
  • Crystal Structure
  • Detectors
  • Energy Bands
  • Fermi Levels
  • Field Effect Transistors
  • Materials
  • Materials Science
  • Measurement
  • Optical Properties
  • Semiconductors
  • Silicon Carbide
  • Solid State Physics
  • Spectra
  • Spectroscopy
  • Transition Metals

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene