In-Situ Laser Doping of Silicon Carbide. Presentation at the March 1998 Meeting of the American Physical Society

Abstract

This Technical Document is a compilation of posters presented at the March 1998 meeting of the American Physical Society in Los Angeles, CA. It summarizes the inherent difficulties in fabricating silicon carbide microelectronic devices, the novel laser setup used to form electrical junctions in silicon carbide, detailed analyses of the laser-processed materials, and applications for this technique. This is the first reported demonstration of incorporation and activation of dopants into silicon carbide using excimer laser recrystalization in the presence of a doping ambient.

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Document Details

Document Type
Technical Report
Publication Date
Aug 01, 1998
Accession Number
ADA354054

Entities

People

  • A. D. Ramirez
  • S. D. Russell

Organizations

  • Naval Information Warfare Systems Command

Tags

DTIC Thesaurus Topics

  • Carbides
  • Ceramic Materials
  • Compound Semiconductors
  • Demonstrations
  • Electrical Engineering
  • Electronic Mail
  • Elements
  • Engineering
  • Excimer Lasers
  • Information Operations
  • Lasers
  • Materials
  • Military Research
  • Naval Warfare
  • Silicon
  • Silicon Carbide
  • Technical Information Centers

Fields of Study

  • Physics

Readers

  • Academic Conference Management
  • Semiconductor Device Technology

Technology Areas

  • Directed Energy
  • Microelectronics
  • Microelectronics - Graphene