Portable Total Integrated Scatter and Retro-Reflectance Instrument

Abstract

A summary of the work performed to determine the feasibility of manufacturing a portable instrument to measure the Total Integrated Scatter and Retro-Reflectance with respect to wavelength is given. The results of a fully functioning breadboard which measures the TIS and Retro-Reflectance of a surface at a laser wavelength are presented. The breadboard demonstrates the enabling technology of a novel, patented ellipsoidal cavity (patent #5,659,397) that is significantly smaller than conventional methods for making TIS and Retro-Reflectance measurements. The performance of the ellipsoidal cavity was demonstrated and a design study to adapt this technology for use in conjunction with a scanning FTIR spectrometer was performed. TIS and Retro-Reflectance measurements of metals and thermal control coating are presented. A Lambertian study of Labsphere's SRS-99 Spectralon(TM) and IRT-94 InfraGold(TM) are presented. In addition, an attempt to measure the retro-reflectance of a solid model rocket plume is presented.

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Document Details

Document Type
Technical Report
Publication Date
Jan 05, 1998
Accession Number
ADA366861

Entities

People

  • John S. Harchanko

Tags

Communities of Interest

  • Weapons Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Angle Of Incidence
  • Detection
  • Detectors
  • Frequency
  • Instrumentation
  • Laser Beams
  • Lasers
  • Manufacturing
  • Materials
  • Measurement
  • Measuring Instruments
  • Optical Detection
  • Optical Properties
  • Reflectance
  • Tuning Forks
  • Waveplates

Readers

  • Optical Physics and Photonics.
  • Software Engineering
  • Spectroscopy.

Technology Areas

  • Directed Energy