Ionic Doping of Low-Conductivity Structural Resins for Improved Direct-Current Sensing
Abstract
This investigation developed a methodology for doping high-resistivity vinyl-ester (VE) resins with an organic dopant. The polymeric resin system investigated was a Dow Derakane 411-C50 VE resin. A number of potential dopants were studied, and two in particular, tetrabutylammonium acetate (TA) and tetrabutylammonium iodide, were found to be capable of increasing the ionic conductivity of VE resin without adversely affecting the resin viscosity, mechanical properties, or reaction kinetics. The primary candidate dopant that was characterized in this investigation was a TA organic salt. TA, at a 0.1-weight-percent (wt%) concentration, was shown to have negligible effects on the mechanical properties and reaction kinetics of a curing VE part. TA was also found to slightly increase the rate at which viscosity increases, but not to the extent that would hinder resin transfer molding of a doped VE system. This investigation has proven that doping of VE resin with 0. 1-wt% TA is a viable means of controlling and tailoring the conductivity of high-resistivity resins for the application of direct-current (DC)-sensing technology.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 01, 2000
- Accession Number
- ADA378811
Entities
People
- Bruce K. Fink
- John W. Gillespie Jr.
- Kenric M. England
Organizations
- United States Army Research Laboratory