Statistical Aspects of Optical or Microwave Measurements of Material Properties
Abstract
We seek a deeper understanding of the effect of noise on the measurement of material properties. We have found very few articles on the issue of measurement error associated with optical systems or antenna apertures that might be used to measure material properties. This report is an initial study of apertures and errors that may be associated with the use of apertures in the measurement of material properties. Bandwidth limited white noise generated by using the Rice algorithm is simulated in the aperture. Using a Legendre curve fining technique, the diffraction pattern was smoothed and image resolution was enhanced. Since the diffraction pattern first minimum permits estimation of radiation frequency, the effect of input noise on the location of the first minimum of the diffraction pattern was evaluated.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 2000
- Accession Number
- ADA385558
Entities
People
- Michael G. Block
- Richard A. Albanese