Analysis of the Radiation Environment Effects on Electronic Components in Near-Earth Orbits
Abstract
The radiation environments at two low altitude orbits have been calculated with the NASA space environment models and codes AP8/AE8, Vette, and CREME. LET spectra and device upset rates for various solar activity scenarios have been determined. Dose deposition into silicon targets as a function of Aluminum shielding thickness has been also calculated with a Monte Carlo code. The results indicate that parameters such as orbit altitude, shielding thickness, and solar activity strongly affect the SEU rates.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 2000
- Accession Number
- ADA385577
Entities
People
- E. B. Horvath
- L. Varga
- Thomas Cousins
Organizations
- Defence Research and Development Canada