Sapphire Statistical Characterization and Risk Reduction (SSCARR) Program for Windows and Domes

Abstract

This paper contains the slide used in a presentation on 18 August 1999, concerning the IRIS Speciality Group Meeting on Materials and Detectors, Lexington, MA.

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Document Details

Document Type
Technical Report
Publication Date
Aug 18, 1999
Accession Number
ADA390436

Entities

People

  • Donald Mcclure
  • Robert Cayse

Tags

Communities of Interest

  • Weapons Technologies

DTIC Thesaurus Topics

  • Aerial Warfare
  • Air Force
  • Bulk Materials
  • Data Sets
  • Databases
  • Detectors
  • Fabrication
  • Flexural Strength
  • Heat Flux
  • Information Science
  • Kill Vehicles
  • Lessons Learned
  • Materials
  • Orientation (Direction)
  • Single Crystals
  • Statistical Analysis
  • Test And Evaluation

Readers

  • Academic Conference Management
  • Missile Defense Systems.
  • Nanofabrication and Microfabrication.