Fragment-Field Analysis Testing System

Abstract

Physical Sciences Inc. (PSI) developed for the USAF Air Armament Center (AAC), Eglin AFB an arena test explosive warhead fragment characterization system. PSI's FRagment-Field Analysis testing (FRAT) system records a spatial impact location to an accuracy of approximately 1% of the screen area with a resolution time of 1 microns. PSI's innovative approach detects impact locations by encoding an electrical signal that is location dependent. PSI's FRAT system provides substantial improvements over the current system, by better distinguishing between intermittent contacts of the same fragment and multiple fragments as well as recording simultaneous fragment impacts on the same impact switch screen. Spatially and temporally resolved fragment impacts can then be correlated with recovered fragment masses. The fragment mass and impact characterization data coupled with an existing computational model, produces range dependent representations of fragment velocity, momentum, and kinetic energy of warhead fragments. PSI's FRAT system also furnishes electronic interfaces with AAC's Test Data Visualization System for enhanced data presentation.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Mar 01, 2001
Accession Number
ADA421779

Entities

People

  • Peter Nebolsine
  • Richard C Barnard

Organizations

  • Physical Sciences (United States)

Tags

Communities of Interest

  • Weapons Technologies

DTIC Thesaurus Topics

  • Acquisition
  • Air Force
  • Bench Top Testing
  • Blast Waves
  • Control Panels
  • Data Acquisition
  • Data Analysis
  • Data Storage Systems
  • Electrodes
  • Explosives
  • Graphical User Interface
  • Hand Grenades
  • Impact Point
  • Materials
  • New England
  • Test Methods
  • User Interface

Readers

  • Computer Science/Computer Engineering/Data Science/Digital Signal Processing.
  • Explosive Engineering.
  • Image Processing and Computer Vision.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems