A Preisach Model for Quantifying Hysteresis in an Atomic Force Microscope

Abstract

Atomic force microscopes employ stacked or cylindrical piezoceramic actuators to achieve sub-angstrom resolution. While these devices produce excellent set-point accuracy, they exhibit hysteresis and constitutive nonlinearities even at low drive levels. Feedback mechanisms can mitigate the deleterious effects of these nonlinearities for low frequency operation but such techniques fail at higher frequencies due to increased noise to signal ratios. In this paper, we quantify the hysteresis and constitutive nonlinearities through a Preisach model. As illustrated through a comparison with experimental data, this provides a characterization which is sufficiently accurate for inclusion as an inverse compensator in various control designs.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2002
Accession Number
ADA451962

Entities

People

  • Luke Cherveny
  • Murti Salapaka
  • Ralph C. Smith

Organizations

  • North Carolina State University

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Actuators
  • Air Force
  • Coefficients
  • Construction
  • Displacement
  • Domain Walls
  • Electric Fields
  • Electrical Engineering
  • Experimental Data
  • Frequency
  • Hysteresis
  • Materials
  • Microscopes
  • North Carolina
  • Piezoelectric Materials
  • Transducers
  • Two Dimensional

Readers

  • Computational Modeling and Simulation
  • Materials Science and Engineering.
  • Optical Physics and Photonics.