Computationally Efficient Substrate Noise Coupling Estimation in Lightly Doped Silicon Substrates

Abstract

A Z-parameter based macromodel for characterizing the substrate noise coupling in a lightly doped substrate at low frequencies has been developed. The model is scalable with contact geometries and separation. The cross-coupling impedance between two contacts is modeled using an improved geometric mean distance formulation. This approach obviates the need for using several spacing related parameters for describing the contact separations, sizes, and orientation. An improved self-impedance model has also been developed. Proximity effects of neighboring contacts are taken into account by a paneling approach. The macromodel with paneling has been successfully used to predict the noise coupling for multi-contact examples. The errors from the macromodel relative to a numerical simulator are within acceptable limits of 15%.

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Document Details

Document Type
Technical Report
Publication Date
Sep 22, 2006
Accession Number
ADA471309

Entities

People

  • Kavitha Srinivasan

Organizations

  • Oregon State University

Tags

Communities of Interest

  • Advanced Electronics
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Abstracts
  • Accuracy
  • Computations
  • Computers
  • Curve Fitting
  • Data Sets
  • Diagrams
  • Electrical Engineering
  • Engineering
  • Fittings
  • Frequency
  • Geometry
  • Impedance
  • Molecular Mechanics Methods
  • Orientation (Direction)
  • Simulations
  • Simulators

Fields of Study

  • Physics

Readers

  • Control Systems Engineering.
  • Integrated Circuit Design and Technology.
  • Semiconductor Device Technology

Technology Areas

  • Space