Novel Form Birefringence Modeling for an Ultracompact Sensor in Porous Silicon Films Using Polarization Interferometry

Abstract

The optical form birefringence in porous silicon films is measured by analyzing the transmitted interference intensity of a polarization interferometer. A novel form birefringence model called "boundary condition (BC) model" for porous materials is introduced and evaluated experimentally against samples of porous silicon films. The variation of optical indexes of refraction vs the porosity in silicon films agrees with the calculated values of n(sub 0)/n(sub e) within 1% error using the BC model, in contrast to the ~15% error using effective medium approximation model.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 2005
Accession Number
ADA471427

Entities

People

  • Beom-hoan O
  • Byeong-gwon Kang
  • Chul-hyun Choi
  • Dong-gue Park
  • Michael J. Sailor
  • Min-woo Lee
  • Rong Liu
  • Soo-beom Jo
  • Sun-hyung Kim
  • Yang Y. Li
  • Yeshaiahu Fainman

Organizations

  • Inha University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Angle Of Incidence
  • Birefringence
  • Boundaries
  • Coordinate Systems
  • Electric Fields
  • Electronic Mail
  • Engineering
  • Equations
  • Intensity
  • Interferometry
  • Optical Phenomena
  • Polarization
  • Porosity
  • Porous Materials
  • Refractive Index
  • Schematic Diagrams
  • Universities

Fields of Study

  • Physics

Readers

  • Computational Modeling and Simulation
  • Nanofabrication and Microfabrication.
  • Spectroscopy.