Borehole X-Ray Fluorescence Spectrometer (XRFS): User's Manual, Software Description, and Performance Report
Abstract
The X-ray fluorescence spectrometer (XRFS) is designed to be deployed down a predrilled hole for exploration and elemental analysis of subsurface planetary regolith. The spectrometer excites atoms in the regolith and causes them to emit their characteristic X-rays. These characteristic X-rays produce peaks in the Xray spectrum. By measuring the energy of the X-rays, elements are identified. By measuring the intensity of the peaks, the amount of each element can be determined. A software package operates the spectrometer, acquires the data, and analyzes the spectrum to provide elements and their weight fractions. It also provides a user interface to control the measurements and display the results.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 2007
- Accession Number
- ADA475892
Entities
People
- E. Willard-schmoe
- I. A. Carlberg
- W. C. Kelliher
- W. T. Elam
Organizations
- University of Washington