Forensics Image Background Matching Using Scale Invariant Feature Transform (SIFT) And Speeded Up Robust Features (SURF)

Abstract

In criminal investigations, it is not uncommon for investigators to obtain a photograph or image that shows a crime being committed. Additionally, thousands of pictures may exist of a location, taken from the same or varying viewpoints. Some of these images may even include a criminal suspect or witness. One mechanism to identify criminals and witnesses is to group the images found on computers, cell phones, cameras, and other electronic devices into sets representing the same location. One or more images in the group may then prove the suspect was at the crime scene before, during,and/or after a crime. This research extends three image feature generation techniques, the Scale Invariant Feature Transform (SIFT), the Speeded Up Robust Features (SURF), and the Shi-Tomasi algorithm, to group images based on location. The image matching identifies keypoints in images with changes in the contents, viewpoint, and individuals present at each location. After calculating keypoints for each image, the algorithm stores the strongest features for each image are stored to minimize the space and matching requirements.

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Document Details

Document Type
Technical Report
Publication Date
Dec 20, 2007
Accession Number
ADA476943

Entities

People

  • Paul N. Fogg Ii

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Biomedical
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Air Force
  • Algorithms
  • Computational Complexity
  • Computational Science
  • Computer Vision
  • Computers
  • Databases
  • Department Of Defense
  • Detection
  • Detectors
  • Image Recognition
  • Image Registration
  • Information Operations
  • Object Recognition
  • Operating Systems
  • Recognition
  • Three Dimensional

Fields of Study

  • Computer science

Readers

  • Image Processing and Computer Vision.
  • Military History of the United States in the 20th Century.
  • Neural Network Machine Learning.

Technology Areas

  • Microelectronics
  • Space