Degradation, Reliability, and Failure of Semiconductor Electronic Devices

Abstract

We show how defects in semiconductor device structures are formed, how they can affect the properties and reliability of devices, and how they might be avoided. Examples will be drawn from wide band gap semiconductor materials and devices we have fabricated in-house or examined for DARPA, collaborators in the P&E CTA, a power electronics MTO, or an SBIR.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 2006
Accession Number
ADA481246

Entities

People

  • K. A. Jones
  • K. W. Kirchner
  • M. A. Derenge
  • M. C. Wood
  • M. H. Ervin
  • T. S. Zheleva

Organizations

  • United States Army Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Band Gaps
  • Charge Carriers
  • Chemical Vapor Deposition
  • Compound Semiconductors
  • Crystals
  • Electric Vehicles
  • Electronics
  • Energy Bands
  • Energy Gaps
  • Epitaxial Growth
  • Materials
  • Metal-Semiconductor Junctions
  • Power Electronics
  • Semiconductor Devices
  • Semiconductors
  • Silicon Carbide
  • Wide Bandgap Semiconductors

Readers

  • Integrated Circuit Design and Technology.
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics