Proton Irradiation of InAs/AlSb/GaSb Resonant Interband Tunneling Diodes
Abstract
Room temperature current voltage measurements have been made on InAs/AlSb/GaSb resonant interband tunnel diodes (RITDs) irradiated with 2 MeV protons to determine the effect of displacement damage on the negative resistance peak current I(sub p) and the peak-to-valley current ratio P/V. Diodes with 5 and 13 ML AlSb barrier thickness were irradiated and measured several times until the total fluences reached 1 x 10(exp 15) and 2 x 10(exp 14) H(+)/sq cm, respectively. The current due to radiation-induced defects has a nonlinear voltage dependence with a large increase occurring in the voltage range between the negative resistance peak and the valley. I(sub p) increased less than 50%, while a large increase in the valley current decreased the P/V ratios to about 2.
Document Details
- Document Type
- Technical Report
- Publication Date
- Apr 23, 2001
- Accession Number
- ADA482493
Entities
People
- Allan S. Bracker
- B. D. Weaver
- Brian R. Bennett
- Richard Magno
Organizations
- United States Naval Research Laboratory