Flux Pinning in YBa2Cu3O7-delta Thin Film Samples Linked to Stacking Fault Density (Postprint)

Abstract

In this paper, we report a strong correlation between the stacking fault (SF) density and the critical current density of YBa2Cu3O7-8; (YBCO) thin films in applied field (J sub c (in-field)). We found that the J sub c (in-field) (H||c) increases as a clear linear dependence of the density of SF identified in the as-grown samples deposited on both SrTiO3 (STO) and LaAlO3 substrates. Detailed microstructural studies including cross-section transmission electron microscopy (TEM) and high resolution TEM were conducted for all the films deposited on STO substrates. This work suggests that the YBCO SF density plays an important role in the YBCO in-field transport performance.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 2008
Accession Number
ADA492334

Entities

People

  • F. J. Baca
  • Hao Wang
  • J. Yoon
  • Jingxian Wang
  • Jinha Kwon
  • N. A. Pierce
  • Paul N. Barnes
  • Timothy J. Haugan

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Air Force Research Laboratories
  • Current Density
  • Electron Microscopes
  • Electron Microscopy
  • Films
  • High Resolution
  • Laboratory Magnetometers
  • Magnetic Fields
  • Microscopy
  • Physical Properties
  • Substrates
  • Thin Films
  • Transmission Electron Microscopy
  • Transport Properties
  • Transport Ships
  • Two Dimensional

Fields of Study

  • Physics

Readers

  • Nanofabrication and Microfabrication.
  • Superconducting Magnet Technology
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene