Extraordinary magnetoresistance in shunted chemical vapor deposition grown graphene devices
Abstract
We report gate tunable linear magnetoresistances (MRs) of ~600% at 12 T in metal-shunted devices fabricated on chemical vapor deposition (CVD) grown graphene. The effect occurs due to decreasing conduction through the shunt as the magnetic field increases (known as the extraordinary magnetoresistance effect) and yields an MR that is at least an order-of-magnitude higher than in un-shunted graphene devices.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 2011
- Accession Number
- ADA554780
Entities
People
- Adam L. Friedman
- Frank Keith Perkins
- Jeremy T. Robinson
- Paul M. Campbell
Organizations
- United States Naval Research Laboratory