Data Modulation Test Equipment for Microcavity Transistor Lasers

Abstract

We have demonstrated room temperature error free data transmission up to 40 Gb/s for our Microcavity Laser (micron CL) and 20 Gb/s for Transistor Laser (TL). In order to characterize our laser devices at data rate greater than 50 Gb/s, the current instrument limitations need to be overcome. Thus, we plan to get higher speed pattern generator and sampling oscilloscope modules. Under the Army Research Office (ARO) contract W911NF-13-10287, we have purchased the SHF 1001A mainframe module, which includes SHF 12103A Dual Channel Differential 56 Gb/s Bit Pattern Generator and the SHF 78210B Synthesized Signal Generator, and Agilent 86107A-040 Precision Time Base Module. With the new instruments, we were able to characterize the signal integrity of our micron CL up to 56 Gb/s.

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Document Details

Document Type
Technical Report
Publication Date
Sep 04, 2014
Accession Number
ADA619337

Entities

People

  • Curtis Wang
  • Michael Liu
  • Milton Feng

Organizations

  • University of Illinois Urbana–Champaign

Tags

Communities of Interest

  • Advanced Electronics
  • Human Systems

DTIC Thesaurus Topics

  • Amplifiers
  • Contracts
  • Data Rate
  • Department Of Defense
  • Dual Channel
  • Engineering
  • Generators
  • Military Research
  • Mixing
  • Modulation
  • Oscilloscopes
  • Quantum Wells
  • Signal Generators
  • Standards
  • Students
  • Test Equipment
  • Transistors

Fields of Study

  • Physics

Readers

  • Electrical Engineering
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Research Science/Academic Research

Technology Areas

  • Directed Energy