Dwell, Interface Defeat, and Penetration of Long Rods Impacting Silicon Carbide

Abstract

Test data, analyses, and computed results for gold rods impacting silicon carbide targets are presented. This work focuses on the dwell phenomenon exhibited by silicon carbide, but also investigates the penetration response. Experiments are presented for several target configurations including targets that use a small diameter buffer, targets that use a large diameter buffer, and targets that use no buffer. In-depth analyses of the data are presented. A significant finding is the nonlinear penetration velocity that occurs for impact velocities of 800 - 1500 m/s. The results demonstrate the significant effect a buffer has on interface defeat, and demonstrate that silicon carbide can resist extremely large surface stresses (~25 GPa) without the use of any confinement or prestress. Computations are also presented that identify the critical design parameters of the buffer including the effect of buffer geometry and buffer separation.

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Document Details

Document Type
Technical Report
Publication Date
Feb 04, 2009
Accession Number
ADA637030

Entities

People

  • Charles E. Anderson Jr.
  • Dennis L. Orphal
  • Matthias Wickert
  • Thilo Behner
  • Timothy J Holmquist

Organizations

  • Southwest Research Institute

Tags

DTIC Thesaurus Topics

  • Algorithms
  • Cameras
  • Carbides
  • Ceramic Materials
  • Compound Semiconductors
  • Computations
  • Diameters
  • Dwell Time
  • Elements
  • Experimental Data
  • Geometry
  • Materials
  • Materials Science
  • Measurement
  • Mechanics
  • Regression Analysis
  • Silicon Carbide

Fields of Study

  • Physics

Readers

  • Explosive Engineering.
  • Materials Science (Mechanical Engineering).
  • Semiconductor Device Technology